Titlebook: Circuit Design for Reliability; Ricardo Reis,Yu Cao,Gilson Wirth Book 2015 Springer Science+Business Media New York 2015 Embedded Systems.

太平间

书目名称Circuit Design for Reliability影响因子(影响力)




书目名称Circuit Design for Reliability影响因子(影响力)学科排名




书目名称Circuit Design for Reliability网络公开度




书目名称Circuit Design for Reliability网络公开度学科排名




书目名称Circuit Design for Reliability被引频次




书目名称Circuit Design for Reliability被引频次学科排名




书目名称Circuit Design for Reliability年度引用




书目名称Circuit Design for Reliability年度引用学科排名




书目名称Circuit Design for Reliability读者反馈




书目名称Circuit Design for Reliability读者反馈学科排名

烧瓶

Atomistic Simulations on Reliability,te length is aggressively scaled, have recently been researched as a major cause of reliability degradation observed in intra-die and die-to-die threshold voltage variation on the same chip resulting in significant variation in saturation drive (on) current and transconductance degradation—two key m

责难

Affection

GET

Circuit Resilience Roadmap,us noise sources, and (b) an increase in parametric variability. This chapter examines the issue of circuit resilience by studying ongoing trends in technology scaling. Additional experiments with basic circuit blocks, such as memory or logic cells, reveal insights into their behavior for future tec

挖掘

Layout Aware Electromigration Analysis of Power/Ground Networks, parameters affecting EM wire lifetime and we introduce some background related to the existing EM physical simulators. In our work, for EM physical simulation we adopt the atomic concentration balance-based model. We discuss the simulation setup and results. We present VEMA—a variation-aware electr

挖掘

Integrate

Soft Error Rate and Fault Tolerance Techniques for FPGAs,vironment. This chapter will present a set of fault mitigation techniques for SRAM, FLASH and ANTIFUSE-based FPGAs and a test methodology to characterize those FPGA under radiation. Results from neutron-induced faults will be presented and compared.

易于

纪念