Titlebook: Circuit Design for Reliability; Ricardo Reis,Yu Cao,Gilson Wirth Book 2015 Springer Science+Business Media New York 2015 Embedded Systems.

Conduit

Grundlagen interkommunaler Zusammenarbeitus noise sources, and (b) an increase in parametric variability. This chapter examines the issue of circuit resilience by studying ongoing trends in technology scaling. Additional experiments with basic circuit blocks, such as memory or logic cells, reveal insights into their behavior for future tec

爵士乐

https://doi.org/10.1007/978-3-663-05707-9 parameters affecting EM wire lifetime and we introduce some background related to the existing EM physical simulators. In our work, for EM physical simulation we adopt the atomic concentration balance-based model. We discuss the simulation setup and results. We present VEMA—a variation-aware electr

Largess

怕失去钱

Christopher R. Thomas,Juliana T. Magloirevironment. This chapter will present a set of fault mitigation techniques for SRAM, FLASH and ANTIFUSE-based FPGAs and a test methodology to characterize those FPGA under radiation. Results from neutron-induced faults will be presented and compared.

Coronary

说明

Christopher R. Thomas,Juliana T. Magloire, tight power budgets have lowered supply voltage levels which make designs more sensitive to noise. Together, variability and noise present a colossal challenge to clock designers in order to meet timing, yield, and power simultaneously. This chapter discusses the different strategies that designer

MULTI

Christopher R. Thomas,Juliana T. Magloirevironment. This chapter will present a set of fault mitigation techniques for SRAM, FLASH and ANTIFUSE-based FPGAs and a test methodology to characterize those FPGA under radiation. Results from neutron-induced faults will be presented and compared.

陈腐思想

摸索

假装是我

Introduction,The scaling of CMOS technology to the nanometer regime inevitability increases reliability concerns, profoundly impacting all aspects of circuit performance and posing a fundamental challenge to future IC design. These reliability concerns arise from many different sources, and become more severe with continuous scaling.