Titlebook: Circuit Design for Reliability; Ricardo Reis,Yu Cao,Gilson Wirth Book 2015 Springer Science+Business Media New York 2015 Embedded Systems.

慢跑鞋

Charge Trapping Phenomena in MOSFETS: From Noise to Bias Temperature Instability,Charge trapping phenomena is known to be a major reliability concern in modern MOSFETS, dominating low-frequency noise behavior and playing a significant role in aging effects such as Bias Temperature Instability (BTI). In this chapter we address this reliability issue.

轻快走过

Karl-Otto Wenkel,Alfred Schultzut defect properties can be obtained from deeplyscaled devices, and that this information can allow projection of variability issues of future deeply downscaled CMOS devices. The chapter is concluded by showing the most promising technological solutions to alleviate both PBTI and NBTI.

感激小女

nerve-sparing

Grundlagen interkommunaler Zusammenarbeitechnology scaling. Additional experiments with basic circuit blocks, such as memory or logic cells, reveal insights into their behavior for future technology generations and major threats for circuit resilience.

妨碍

Christopher R. Thomas,Juliana T. Magloirel challenge to clock designers in order to meet timing, yield, and power simultaneously. This chapter discusses the different strategies that designers use to ameliorate variability and noise problems in clock network design.

摇曳的微光

Circuit Resilience Roadmap,echnology scaling. Additional experiments with basic circuit blocks, such as memory or logic cells, reveal insights into their behavior for future technology generations and major threats for circuit resilience.

CROAK

Variability-Aware Clock Design,l challenge to clock designers in order to meet timing, yield, and power simultaneously. This chapter discusses the different strategies that designers use to ameliorate variability and noise problems in clock network design.

Intrepid

https://doi.org/10.1007/978-3-663-05707-9nalysis tool; it extracts the effective . product values and performs a via-centric EM lifetime calculation on ideally manufactured EM-mortal wires. It analyzes process variation effects on EM reliability and reports variation tolerances of EM-sensitive power grid wires.

AWL

口诀

Book 2015ve to enhance the reliability of various circuit units.  The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.