Titlebook: Atomic Force Microscopy; Bert Voigtländer Book 2019Latest edition Springer Nature Switzerland AG 2019 Scanning Probe Microscopy.Lock-In Te

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Harmonic Oscillator,In atomic force microscopy, vibrations play a central role in several areas: in vibration isolation and in dynamic atomic force microscopy. Therefore, In this chapter we will study the mechanical harmonic oscillator.

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Cantilevers and Detection Methods in Atomic Force Microscopy,We consider basic requirements for force sensors and introduce a fabrication process for cantilevers. Subsequently, the most common detection method for measuring the cantilever deflection, the beam deflection method, is discussed in detail.

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Intermittent Contact Mode/Tapping Mode,Here we introduce the intermittent contact mode (or tapping mode) which is the mode that is used most frequently at ambient conditions.

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Atomic Force Microscopy978-3-030-13654-3Series ISSN 1434-4904 Series E-ISSN 2197-7127

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Cumulative Fatigue Damage Analysis,g a transition from microelectronics to nanoelectronics. As transistors with critical dimensions in the the single digit nanometer range are now in production, consumer electronics products contain now real nanoelectronic devices. Also in many other areas the progress toward the nanoscale is under way.