Titlebook: Atomic Force Microscopy; Bert Voigtländer Book 2019Latest edition Springer Nature Switzerland AG 2019 Scanning Probe Microscopy.Lock-In Te

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Introduction,g a transition from microelectronics to nanoelectronics. As transistors with critical dimensions in the the single digit nanometer range are now in production, consumer electronics products contain now real nanoelectronic devices. Also in many other areas the progress toward the nanoscale is under way.

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Technical Aspects of Atomic Force Microscopy,precision. We describe the principles of operation of these actuators and present examples of specific actuators. In the following principles of vibration isolation are considered, because the amplitude of floor vibrations is much larger than the desired amplitude of the tip-sample vibrations.

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Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy,Due to the interaction between tip and the surface, the resonance frequency of the cantilever changes. As shown in this chapter, an attractive force between tip and sample leads to a lower resonance frequency of the cantilever, while for repulsive tip-sample forces the resonance frequency increases.

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Mapping of Mechanical Properties Using Force-Distance Curves,mages of elasticity, adhesion and other mechanical properties. Besides access to the mechanical properties, this mode also allows high-resolution imaging, it is a tapping mode under additional force control.

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Patricia Ochoa,Oscar Castillo,José SoriaHere we introduce the intermittent contact mode (or tapping mode) which is the mode that is used most frequently at ambient conditions.

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Patricia Ochoa,Oscar Castillo,José SoriaIn the FM detection scheme of AFM the cantilever does not oscillate at a fixed driving frequency (as in the tapping mode), but always oscillates at resonance. If the resonance frequency shifts due to a tip-sample interaction, the cantilever oscillation frequency follows this shift.