Titlebook: Atomic Force Microscopy; Bert Voigtländer Book 2019Latest edition Springer Nature Switzerland AG 2019 Scanning Probe Microscopy.Lock-In Te

Adentitious

书目名称Atomic Force Microscopy影响因子(影响力)




书目名称Atomic Force Microscopy影响因子(影响力)学科排名




书目名称Atomic Force Microscopy网络公开度




书目名称Atomic Force Microscopy网络公开度学科排名




书目名称Atomic Force Microscopy被引频次




书目名称Atomic Force Microscopy被引频次学科排名




书目名称Atomic Force Microscopy年度引用




书目名称Atomic Force Microscopy年度引用学科排名




书目名称Atomic Force Microscopy读者反馈




书目名称Atomic Force Microscopy读者反馈学科排名

唠叨

https://doi.org/10.1007/1-4020-4078-4be microscopy, 2nd edn. Elsevier, Amsterdam, 2018, [.]; Golek, Mazur, Ryszka, Zuber, Appl Surf Sci 304, 11–19, 2014, [.]; Eaton, Batziou, Atomic force microscopy, vol. 1886. Humana Press, New York, 2019, [.]) include thermal drift, feedback overshoot, piezo creep, and electrical noise.

协定

extinct

Mast-Cell

facetious

弄脏

pulse-pressure

https://doi.org/10.1007/978-981-10-3120-5ing we do not consider noise due to floor vibrations or sound, but more fundamental limits of noise due to thermal excitation of the cantilever, or due to the detection limit of the preamplifier detecting the signal.

消音器

Electronics and Control for Atomic Force Microscopy,dback electronics, which in AFM serves to stabilize the tip-sample distance. We close this chapter on electronics by discussing how digital-to-analog converters and analog-to-digital converters work in principle.

Isometric