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Titlebook: Atomic Force Microscopy; Bert Voigtländer Book 2019Latest edition Springer Nature Switzerland AG 2019 Scanning Probe Microscopy.Lock-In Te

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https://doi.org/10.1007/1-4020-4078-4precision. We describe the principles of operation of these actuators and present examples of specific actuators. In the following principles of vibration isolation are considered, because the amplitude of floor vibrations is much larger than the desired amplitude of the tip-sample vibrations.
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Patricia Ochoa,Oscar Castillo,José Soriaraphy. Before we describe the atomic force microscopy technique in detail, we consider the forces acting between tip and sample as well as the tip-sample contact mechanics. We consider also the snap-to-contact phenomenon, which can occur due to attractive tip-sample forces.
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Frumen Olivas,Fevrier Valdez,Oscar Castillomages of elasticity, adhesion and other mechanical properties. Besides access to the mechanical properties, this mode also allows high-resolution imaging, it is a tapping mode under additional force control.
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Cumulative Fatigue Damage Analysis,cy range. Using the lock-in technique the noise can be even much larger than the signal which can nevertheless be measured precisely. In dynamic atomic force microscopy is used for instance to detect the oscillation amplitude.
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