Titlebook: Electron Backscatter Diffraction in Materials Science; Adam J. Schwartz,Mukul Kumar,Brent L. Adams Book 20001st edition Springer Science+B

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Rodrigues-Frank Representations of Crystallographic Texture, too small (such as thin films and nanostructures) to even contain many grains. Yet, while the issues of local texture are still important to assess and interpret in these cases, and while EBSD may provide an experimental means of obtaining texture information, the predominant means of representing

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Automated Electron Backscatter Diffraction: Present State and Prospects, orientation contrast in secondary and backscatter electron images, element distributions are accessed by EDS or cathodoluminescence analysis, and the orientations of single grains and phases can now be determined, as a complement, by EBSD.

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Strategies for Analyzing EBSD Datasets,ll explore additional representations of the EBSD dataseis and data processing software that have been developed to address particular problems encountered during investigations. Specific examples include: “clean-up” of dataseis; mapping of lattice rotations in deformed single crystals; three-dimens

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Anisotropic Plasticity Modeling Incorporating EBSD Characterization of Tantalum and Zirconium,uctures. The ability to spatially resolve orientation differences on the order of 100 nm is achievable. All EBSD data collection and analysis was performed with TSL’s OIM™ software, while the popLA code (Kallend et al., 1991) was used for x-ray texture analysis.

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Heterogeneous Wireless Access NetworksD. Full automation of EBSD in 1991 led to the mapping of crystal orientation over a sample surface and to a new metallography, termed “Orientation Imaging Microscopy” by Adams et al., (1993). It was this innovation that gave rise to the current rapid growth of the technique and to its full commercia

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https://doi.org/10.1007/978-3-531-94209-4n, backscatter Kikuchi diffraction, BKD, is an add-on package to an SEM. The most attractive feature of the technique is its unique capability to perform concurrently rapid, (usually) automatic diffraction analysis to give crystallographic data and imaging with a spatial resolution of less than 0.5

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