Titlebook: Electron Backscatter Diffraction in Materials Science; Adam J. Schwartz,Mukul Kumar,Brent L. Adams Book 20001st edition Springer Science+B

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https://doi.org/10.1007/978-3-531-92893-7iffraction bands with a focus on the Hough transform will be given; methods for determining orientation using diffraction bands will be detailed; issues concerning automated indexing uncertainties will be discussed; a description of the relevant structural data needed by the computer to index the pa

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Franziska Götz,Wolfgang Rohde,Günter Dörner (or TexSEM Laboratories) in 1994 to produce the first commercial automated EBSD system based on the system developed by the group at Yale University (Adams, Wright, and Kunze). TSL adopted the name OIM™ for its automated EBSD products. Much of what was included in the original TSL system has become

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Book 20001st editionstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming transmission electron microscope (TEM) or x-ray diffraction investigations. The benefits lie in the fact that the spatial resolution on new field emission scanning electron microscopes (SEM) can appr

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