| 书目名称 | Electron Backscatter Diffraction in Materials Science | | 编辑 | Adam J. Schwartz,Mukul Kumar,Brent L. Adams | | 视频video | | | 图书封面 |  | | 描述 | Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then of sales worldwide has been dramatic. This has accompanied widening the growth applicability in materials scienceproblems such as microtexture, phase identification, grain boundary character distribution, deformation microstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming transmission electron microscope (TEM) or x-ray diffraction investigations. The benefits lie in the fact that the spatial resolution on new field emission scanning electron microscopes (SEM) can appr | | 出版日期 | Book 20001st edition | | 关键词 | EBSD explained; backscattered electron generation; crystal; deformation; diffraction; elastic strains; ele | | 版次 | 1 | | doi | https://doi.org/10.1007/978-1-4757-3205-4 | | isbn_ebook | 978-1-4757-3205-4 | | copyright | Springer Science+Business Media New York 2000 |
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发表于 2025-3-21 18:40:41
