Titlebook: CMOS Test and Evaluation; A Physical Perspecti Manjul Bhushan,Mark B. Ketchen Book 2015 Springer Science+Business Media New York 2015 CMOS

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product test debug, yield and performance evaluation.DescribCMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology proce

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Hercília Maria Lins Rolim,Thais Cruz Ramalhooss defects early in the test flow. DC and AC components of total power in the active mode are functions of power supply voltage, switching activity and temperature. Circuit design strategies and dynamic on-chip power management schemes help alleviate potential reliability issues and rising energy cost of high performance CMOS chips.

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Christian Ngô,Marcel H. Van de Voordeeir characterization are therefore important components of electrical testing. Efforts are made to maximize yield by accommodating anticipated sources of variations in chip design and by minimizing their impact with continuous improvements in the manufacturing process.

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Book 2015vering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization technique

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https://doi.org/10.1007/978-3-030-35147-2hting their interdependencies. Delay chains and ring oscillator configurations used for model validation in silicon hardware are described and simulated to extract delay parameters of logic gates. The foundations laid here including Monte Carlo analysis for determining parameter spreads are used throughout the book.