| 书目名称 | CMOS Test and Evaluation | | 副标题 | A Physical Perspecti | | 编辑 | Manjul Bhushan,Mark B. Ketchen | | 视频video | | | 概述 | Relates CMOS product performance to basic physical models of transistors and passive elements.Uses embedded test structures and sensors for product test debug, yield and performance evaluation.Describ | | 图书封面 |  | | 描述 | CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range. | | 出版日期 | Book 2015 | | 关键词 | CMOS manufacturing test and quality control; CMOS microelectronic test structures; CMOS products; CMOS | | 版次 | 1 | | doi | https://doi.org/10.1007/978-1-4939-1349-7 | | isbn_softcover | 978-1-4939-4702-7 | | isbn_ebook | 978-1-4939-1349-7 | | copyright | Springer Science+Business Media New York 2015 |
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发表于 2025-3-21 17:59:18
