Titlebook: CMOS Test and Evaluation; A Physical Perspecti Manjul Bhushan,Mark B. Ketchen Book 2015 Springer Science+Business Media New York 2015 CMOS

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Advanced Technologies and Societal Changes are useful for product yield optimization through silicon process tuning and variability reduction. Appropriately designed embedded process monitors can help bridge both upward in the hierarchy to complex circuitry and downward to the properties of the constituent components and to the silicon man

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Christian Ngô,Marcel H. Van de Voordetrical tests are defined to cover the range of operating conditions such as power supply voltage and temperature over which any chip may need to function. The data collected are analyzed to isolate factors influencing chip yield and performance. Understanding the various sources of variations and th

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Digitalis

Christian Ngo,Marcel H. Van de Voordeegree of automation to post-processing of data for rapid feedback and debug. However, domain expertize is a valuable asset and in many cases an essential ingredient for finding the root cause. A brief overview of statistical methods including probability, distributions, correlation, and regression a

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Christian Ngô,Marcel H. Van de Voordeent technology nodes, or between similar technologies on different substrates, such as bulk silicon and SOI. Such comparisons are used in guiding technology development, in benchmarking and selecting the most suitable CMOS manufacturing process or foundry for a given product, and in projecting CMOS

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https://doi.org/10.1007/978-1-4939-1349-7CMOS manufacturing test and quality control; CMOS microelectronic test structures; CMOS products; CMOS