Titlebook: Atom Probe Microscopy; Baptiste Gault,Michael P. Moody,Simon P. Ringer Book 2012 Springer Science+Business Media, LLC 2012 Atom probe data

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Tomographic Reconstructioneasuring the spatial resolution of the reconstruction is presented, along with discussion of the experimental and analytical factors affecting these values. This chapter closes with a description of lattice rectification, an extension to the conventional reconstruction algorithm providing a lattice-based reconstruction.

Cytology

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Analysis Techniques for Atom Probe Tomographyis for the analysis techniques to keep pace with the instrumental developments that are generating vastly larger datasets. These larger datasets themselves open up new computational approaches for data-mining.

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0933-033X ion, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementat978-1-4899-8939-0978-1-4614-3436-8Series ISSN 0933-033X Series E-ISSN 2196-2812

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Book 2012y techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementat

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Malware Biodiversity Using Static Analysis,is for the analysis techniques to keep pace with the instrumental developments that are generating vastly larger datasets. These larger datasets themselves open up new computational approaches for data-mining.

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From Field Desorption Microscopy to Atom Probe Tomographyeedle-shaped specimen. Field evaporation involves the ionisation of these surface atoms, whereupon they are subjected to an electric field force that causes them to accelerate towards a detector under a particular projection. The evaporation event follows immediately after the ionisation of the surf

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Specimen Preparation and often extremely challenging, part of any experiment. Recent developments in instrumentation for atom probe microscopy, such as laser-pulsing and the use of wide-field-of-view detectors, have overcome many of the limitations on the types of materials and microstructures that may be studied. Now,