期刊全称 | Atom Probe Microscopy | 影响因子2023 | Baptiste Gault,Michael P. Moody,Simon P. Ringer | 视频video | | 发行地址 | Provides the most practical, up-to-date and critical review of atom probe microscopy techniques.Presents a detailed description of the analysis tools.Includes practical examples of how the technique c | 学科分类 | Springer Series in Materials Science | 图书封面 |  | 影响因子 | .Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography..Atom Probe Microscopy. is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementat | Pindex | Book 2012 |
The information of publication is updating
|
|