| 期刊全称 | Applied Scanning Probe Methods VIII | | 期刊简称 | Scanning Probe Micro | | 影响因子2023 | Bharat Bhushan,Harald Fuchs,Masahiko Tomitori | | 视频video | | | 发行地址 | First book summarizing the state-of-the-art of this technique.Real industrial applications included.Includes supplementary material: | | 学科分类 | NanoScience and Technology | | 图书封面 |  | | 影响因子 | The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport prop | | Pindex | Book 2008 |
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发表于 2025-3-21 16:57:33
