Titlebook: Applied Scanning Probe Methods VIII; Scanning Probe Micro Bharat Bhushan,Harald Fuchs,Masahiko Tomitori Book 2008 Springer-Verlag Berlin He

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Probing Electrical Transport Properties at the Nanoscale by Current-Sensing Atomic Force Microscopythe fields of material science, electronics and biology. It is concluded that the measurement of direct and alternating currents and of current fluctuations with nanoscale spatial resolution provides an invaluable tool for an understanding of the spatially resolved electrical transport properties at the nanoscale.

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Frequency Modulation Atomic Force Microscopy in Liquids,mental implementations of the technique and its theoretical foundations. In addition, we describe a number of applications that demonstrate the potential of the technique in liquids and highlight future prospects

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Book 2008tions worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under

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R. M. Haynes,B. W. D. Yardley,T. D. Daviesmental implementations of the technique and its theoretical foundations. In addition, we describe a number of applications that demonstrate the potential of the technique in liquids and highlight future prospects

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I Traykov,M Asenova,D Slavova,B Boyanovskyy (SNOM) artifact-free imaging. We describe the principles of apertureless SNOM, detailing the different detection schemes for artifact-free imaging: homodyne and heterodyne detection. Additionally, we detail the physical origin of the measured signals, describe optical artifacts, and discuss experi

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Environmental Role of Wetlands in Headwatersral dimensions of 50 nm and less. Challenges in this measurement range call for research and development in probe design, tip–sample interaction control, tip shape characterization, and image reconstruction algorithms. Design considerations and performance improvements are reviewed throughout the ch

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L. Marchi,F. Michieli,G. M. Zuppiptical microscope (SNOM). In this frame, we consider the two main classes of sensors: aperture and apertureless probes. In particular, attention is focused on optical fiber probes and on nanoantenna probes. Recent developments in the improvement of optical throughput and in the control of the near f