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Titlebook: Ultraclean Surface Processing of Silicon Wafers; Secrets of VLSI Manu Takeshi Hattori Book 1998 Springer-Verlag Berlin Heidelberg 1998 Tech

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发表于 2025-3-21 18:50:18 | 显示全部楼层 |阅读模式
书目名称Ultraclean Surface Processing of Silicon Wafers
副标题Secrets of VLSI Manu
编辑Takeshi Hattori
视频video
概述Handbook on most advanced technologies in surface processing of silicon wafers.
图书封面Titlebook: Ultraclean Surface Processing of Silicon Wafers; Secrets of VLSI Manu Takeshi Hattori Book 1998 Springer-Verlag Berlin Heidelberg 1998 Tech
描述A totally new concept for clean surface processing of Si wafers is introduced in this book. Some fifty distinguished researchers and engineers from the leading Japanese semiconductor companies, such as NEC, Hitachi, Toshiba, Sony and Panasonic as well as from several universities reveal to us for the first time the secrets of these highly productive institutions. They describe the techniques and equipment necessary for the preparation of clean high-quality semiconductor surfaces as a first step in high-yield/high-quality device production. This book thus opens the door to the manufacturing of reliable nanoscale devices and will be extremely useful for every engineer, physicist and technician involved in the production of silicon semiconductor devices.
出版日期Book 1998
关键词Technologie; VLSI; production; quality; semiconductor devices
版次1
doihttps://doi.org/10.1007/978-3-662-03535-1
isbn_softcover978-3-642-08272-6
isbn_ebook978-3-662-03535-1
copyrightSpringer-Verlag Berlin Heidelberg 1998
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t addresses educators, journalists, politicians, language communities and others. The availability and use of language technology in Europe varies between languages. Consequently, the actions that are required to further support research and development of language technologies also differ for each
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Ayako Shimazakiainable approach to global apparel.Advises on a reasonable b.This book discusses the maxim of industrialization with a human face or social upgrading, which currently dominates the academic and actual policy discourses, particularly in late-comer economies of the Global South such as Ethiopia. To un
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Measurement of Particles on Wafer Surfacesr strongly in their detection principles. The use of particle detection on the mirror-polished and filmed wafers plays a major role in monitoring particle generation from equipment. For in-line monitoring and yield analysis, the investigation of patterned wafers is efficient.
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Analysis and Evaluation of Impurities on Wafer Surfacescal techniques are used for a macroscopic analysis, and physical techniques enable the analysis of the state of the contamination in the microscopic range. Table 13.1 lists various analytical methods for impurities on the silicon surface.
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Book 1998gh-quality semiconductor surfaces as a first step in high-yield/high-quality device production. This book thus opens the door to the manufacturing of reliable nanoscale devices and will be extremely useful for every engineer, physicist and technician involved in the production of silicon semiconductor devices.
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