Titlebook: Surface Analysis Methods in Materials Science; D. John O’Connor,Brett A. Sexton,Roger St. C. Smar Textbook 19921st edition Springer-Verlag

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X-Ray Photoelectron Spectroscopy-used technique known as photoelectron (PE) spectroscopy. This technique can be conveniently divided into two broad areas, the first employing ultraviolet radiation, hence called ultraviolet photoelectron spectroscopy (UPS), and the second using X-rays, termed X-ray photoelectron spectroscopy (XPS).

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Fourier Transform Infrared Spectroscopy of Surfacesamples and for quality control of raw materials and commercial products. With the advent of Fourier transform infrared spectroscopy (FTIR) the range of applications and the materials amenable to study has increased enormously, owing to its increased sensitivity, speed, wavenumber accuracy and stabil

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Rutherford Backscattering Spectrometry and Nuclear Reaction Analysis) methods, performed with energetic (typically a few hundred keV to a few MeV) ion beam from accelerators. The energies involved render the measurements insensitive to molecular or atomic shell effects, and thus chemical effects. RBS is based on elastic Coulomb scattering between the projectile and

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Scanning Tunnelling Microscopy with high resolution [10.1–5]. A sharpened metal wire is brought close enough to the surface so that the electrons “tunnel” across the narrow gap (0.5–1.5 nm). A small bias potential (2 mV-2 V) provides the necessary potential difference for tunnelling to occur. As a result of the exponential depen

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Reflection High Energy Electron Diffractiondiffraction spots, and lines attributed to diffuse scattering. Other early workers included . (1936) [12.2] who took diffraction patterns from galena and . (1936) [12.3] who examined oxide surfaces. . et al. [12.4] used RHEED with metal films in 1940 and with adsorbed organic molecules in 1950. Comm

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Low Energy Electron Diffractions science research to study surface structure and bonding and the effects of structure on surface processes. However because it requires single crystals and ultrahigh vacuum conditions it has limited value for applied surface analysis, which is often concerned with polycrystalline or amorphous mater

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