| 书目名称 | Stochastic Process Variation in Deep-Submicron CMOS |
| 副标题 | Circuits and Algorit |
| 编辑 | Amir Zjajo |
| 视频video | |
| 概述 | Unique combination of mathematical treatment of random process variation, electrical noise and temperature and necessary circuit realizations for on-chip monitoring (probably only on the market).Numer |
| 丛书名称 | Springer Series in Advanced Microelectronics |
| 图书封面 |  |
| 描述 | .One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key device parameters affecting performance of integrated circuits. The growth of variability can be attributed to multiple factors, including the difficulty of manufacturing control, the emergence of new systematic variation-generating mechanisms, and most importantly, the increase in atomic-scale randomness, where device operation must be described as a .stochastic. process. In addition to .wide-sense stationary stochastic. device variability and temperature variation, existence of .non-stationary stochastic. electrical noise associated with fundamental processes in integrated-circuit devices represents an elementary limit on the performance of electronic circuits..In an attempt to address these issues, .Stochastic Process Variation in Deep-Submicron CMOS: Circuits and Algorithms. offers unique combination of mathematical treatment of random process variation, electrical noise and temperature and necessary circuit realizations for on-chip monitoring and performance calibration. The associated problems are addressed at various abstraction levels, i.e. circuit leve |
| 出版日期 | Book 2014 |
| 关键词 | Deep-submicron CMOS; Dynamic Thermal Methodology; Electrothermal Couplings; High Performance MPSoC; Low |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-94-007-7781-1 |
| isbn_softcover | 978-94-024-0285-8 |
| isbn_ebook | 978-94-007-7781-1Series ISSN 1437-0387 Series E-ISSN 2197-6643 |
| issn_series | 1437-0387 |
| copyright | Springer Science+Business Media Dordrecht 2014 |
发表于 2025-3-21 19:00:29
