Titlebook: Stochastic Process Variation in Deep-Submicron CMOS; Circuits and Algorit Amir Zjajo Book 2014 Springer Science+Business Media Dordrecht 20

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1437-0387 on, electrical noise and temperature and necessary circuit realizations for on-chip monitoring and performance calibration. The associated problems are addressed at various abstraction levels, i.e. circuit leve978-94-024-0285-8978-94-007-7781-1Series ISSN 1437-0387 Series E-ISSN 2197-6643

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Random Process Variation in Deep-Submicron CMOS,ance of integrated circuits [.]. Although scaling made controlling extrinsic variability more complex, nonetheless, the most profound reason for the future increase in parameter variability is that the technology is approaching the regime of fundamental randomness in the behavior of silicon structur

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