Titlebook: Scanning Tunneling Microscopy II; Further Applications Roland Wiesendanger,Hans-Joachim Güntherodt Textbook 19921st edition Springer-Verlag

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R. Guckenberger,T. Hartmann,W. Wiegräbe,W. Baumeisterighly likely that the failing does not derive from contingent misund- standings, but rather from systemic contradictions. With this in mind, this book suggests a broad-spectrum approach to understanding how state education gets done, so to speak, and what in the process seems to obstruct impartialit

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P. Grütter,H. J. Mamin,D. Rugarl. It is highly likely that the failing does not derive from contingent misund- standings, but rather from systemic contradictions. With this in mind, this book suggests a broad-spectrum approach to understanding how state education gets done, so to speak, and what in the process seems to obstruct impartialit978-94-017-4330-3978-1-4020-8074-6

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U. Stauferl. It is highly likely that the failing does not derive from contingent misund- standings, but rather from systemic contradictions. With this in mind, this book suggests a broad-spectrum approach to understanding how state education gets done, so to speak, and what in the process seems to obstruct impartialit978-94-017-4330-3978-1-4020-8074-6

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0931-5195 es give acomprehensive account ofexperimental aspcets of STM. They provide essentialreadingand reference material for all students and researchersinvolvedin this field.978-3-642-97365-9978-3-642-97363-5Series ISSN 0931-5195 Series E-ISSN 2198-4743

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Scanning Force Microscopy (SFM),. A displacement sensor then measures deflections as small as 10. Å. The first displacement sensor proposed by . et al. was based on electron tunneling. Later, different sensors based on optical interferometry, beam deflection or capacitance measurements were introduced. From the beginning it was ev

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