Titlebook: Scanning Tunneling Microscopy II; Further Applications Roland Wiesendanger,Hans-Joachim Güntherodt Textbook 19921st edition Springer-Verlag

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书目名称Scanning Tunneling Microscopy II影响因子(影响力)




书目名称Scanning Tunneling Microscopy II影响因子(影响力)学科排名




书目名称Scanning Tunneling Microscopy II网络公开度




书目名称Scanning Tunneling Microscopy II网络公开度学科排名




书目名称Scanning Tunneling Microscopy II被引频次




书目名称Scanning Tunneling Microscopy II被引频次学科排名




书目名称Scanning Tunneling Microscopy II年度引用




书目名称Scanning Tunneling Microscopy II年度引用学科排名




书目名称Scanning Tunneling Microscopy II读者反馈




书目名称Scanning Tunneling Microscopy II读者反馈学科排名

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Textbook 19921st editionrvey ofother related techniques. Also described here is the use ofa scanning proximal probe for surface modification.Togehter, the two volumes give acomprehensive account ofexperimental aspcets of STM. They provide essentialreadingand reference material for all students and researchersinvolvedin this field.

Irremediable

STM in Electrochemistry,al electrode properties, investigated by non-electrochemical methods, with the electrochemical system response studied by classical voltammetric techniques and, in particular, electrochemical impedance analysis [2.1].

非秘密

Magnetic Force Microscopy (MFM), original work by . et al., the primary motivation was to observe atomic forces between tip and sample. When operating with the tip and sample in contact, atomic-scale surface topography can be imaged [5.2]. This type of “atomic force microscopy” (AFM) has been discussed in Chap. 4.

GLOSS

珍奇

STM in Electrochemistry,y, since most practically relevant electrochemical systems are characterized by structural and chemical inhomogeneities of the electrode-electrolyte interface. Such inhomogeneities can influence the local mechanisms of electrochemical reactions in a wide resolution interval extending from the sub-nm

他很灵活

BIAS

Magnetic Force Microscopy (MFM),ased on mechanically scanning a sharp tip over a sample surface. One of the most successful of these new microscopes is the scanning force microscope, invented by . and . in 1986 [5.1]. The basic principle of the force microscope is simple. A sharp tip is mounted on a cantilever spring. Forces from

冥界三河

bioavailability

1985 pp. 854ff. ). The means at hand include the state’s structuring and organization of schooling, determination of what education is compulsory, examinations that decide admittance to institutions of secondary and tertiary education, the design of educational aids, curricula, textbooks, didactic m