Titlebook: Scanning Transmission Electron Microscopy; Imaging and Analysis Stephen J. Pennycook,Peter D. Nellist Book 2011 Springer Science+Business M

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Energy Loss Near-Edge Structures,cular subset of analytical signals that allow the extraction of information on the chemical environment of the atoms probed by the fast primary electron beam. Such information is mainly provided in STEM by Energy Loss Near Edge Structures.

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Scanning Electron Nanodiffraction and Diffraction Imaging,alline atomic structures, while the theory for CBED is largely limited to crystals or crystals with certain types of defects. For the treatment of electron multiple scattering of arbitrary structures, we included a description of the multi-slice method, which is a numerical method often used for ele

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Atomic-Resolution STEM at Low Primary Energies,lower energies, and we illustrate the kinds of studies that have now become possible by ADF images of graphene, monolayer BN, and single-wall carbon nanotubes, and by ADF images and EEL spectra of carbon nanotubes containing nanopods filled with single atoms of Er. We then discuss likely future deve

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Book 2011cience, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy. .

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nce for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy. .978-1-4419-7200-2

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