Titlebook: Scanning Transmission Electron Microscopy; Imaging and Analysis Stephen J. Pennycook,Peter D. Nellist Book 2011 Springer Science+Business M

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A Scan Through the History of STEM,Albert Crewe and his collaborators, to its widespread application today in the era of aberration correction. The review focuses on the development and understanding of incoherent imaging and electron energy loss spectroscopy at atomic resolution and will not include details on microanalysis, low los

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Spatially Resolved EELS: The Spectrum-Imaging Technique and Its Applications,echnique. After summarising the information found in an EELS spectrum, the instrumentation and analysis techniques relevant to the SPIM are thoroughly discussed. Finally, applications involving a broad range of energy losses, typically 1–1000 eV, are discussed, in order to illustrate the whole field

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Application to Ceramic Interfaces,ional properties, which cannot be observed in a perfect crystal. These structures are also influenced by the grain boundary and interface characters such as misorientation angle, grain boundary plane, lattice misfit and so on. In the vicinity of the grain boundaries and interfaces around the order o