Titlebook: Scanning Probe Microscopy; Atomic Force Microsc Bert Voigtländer Book 2015 Springer-Verlag Berlin Heidelberg 2015 Atomic Force Microscopy.N

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书目名称Scanning Probe Microscopy影响因子(影响力)




书目名称Scanning Probe Microscopy影响因子(影响力)学科排名




书目名称Scanning Probe Microscopy网络公开度




书目名称Scanning Probe Microscopy网络公开度学科排名




书目名称Scanning Probe Microscopy被引频次




书目名称Scanning Probe Microscopy被引频次学科排名




书目名称Scanning Probe Microscopy年度引用




书目名称Scanning Probe Microscopy年度引用学科排名




书目名称Scanning Probe Microscopy读者反馈




书目名称Scanning Probe Microscopy读者反馈学科排名

Nonconformist

Work Function, Contact Potential, and Kelvin Probe Scanning Force Microscopynction is a measurable quantity and the operative definition of the work function is that it is the energy required to remove an electron from the bulk Fermi level of a metal to a certain distance from the solid.

疲劳

Inertia

Book 2015ues are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field..

终端

1434-4904 textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field..978-3-662-50557-1978-3-662-45240-0Series ISSN 1434-4904 Series E-ISSN 2197-7127

爱国者

Surface Statesite) bulk crystals, they are allowed if a surface is present. Finally, we transfer the one-dimensional model qualitatively to three dimensions and discuss the two-dimensional surface states of a three-dimensional solid.

用肘

Scanning Probe Microscopy Designsp and sample into such a close distance that the (tube) scanner can be used for the fine motion (up to several micrometers) during scanning. The task of coarse positioning largely determines the SPM design since nowadays almost all SPMs use a tube scanner for the fine motion. Here we concentrate on

Grandstand

Work Function, Contact Potential, and Kelvin Probe Scanning Force Microscopyrence between the vacuum level and the Fermi level of a metal. Here we will see that also a surface term contributes to the work function. The work function is a measurable quantity and the operative definition of the work function is that it is the energy required to remove an electron from the bul

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图画文字

Forces Between Tip and Samplebehind the atomic force microscope (AFM) is to measure the force(s) between the surface and the scanning tip in order to track the surface topography. Before we describe the atomic force microscopy technique in detail, we consider the forces acting between tip and sample.