Titlebook: Scanning Probe Microscopy; Atomic Force Microsc Bert Voigtländer Book 2015 Springer-Verlag Berlin Heidelberg 2015 Atomic Force Microscopy.N

grounded

Data Representation and Image ProcessingScanning probe microscopy data usually have the form of a matrix where the topography (height) or some other signal such as the tunneling current, or . is measured as a function of the lateral .-position on the surface.

易于

parsimony

洞穴

业余爱好者

锡箔纸

军械库

Bert VoigtländerPresents the state-of-the-art in scanning probe techniques.Combines basic physical principles and their application to scanning tunneling and atomic force microscopes.Useful study text for graduate st

禁止

978-3-662-50557-1Springer-Verlag Berlin Heidelberg 2015

无能力

Scanning Probe Microscopy978-3-662-45240-0Series ISSN 1434-4904 Series E-ISSN 2197-7127

nonsensical

Forces Between Tip and Samplebehind the atomic force microscope (AFM) is to measure the force(s) between the surface and the scanning tip in order to track the surface topography. Before we describe the atomic force microscopy technique in detail, we consider the forces acting between tip and sample.