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Titlebook: Scanning Electron Microscopy and X-Ray Microanalysis; A Text for Biologist Joseph I. Goldstein,Dale E. Newbury,Eric Lifshin Book 1981 Sprin

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发表于 2025-3-21 16:47:08 | 显示全部楼层 |阅读模式
书目名称Scanning Electron Microscopy and X-Ray Microanalysis
副标题A Text for Biologist
编辑Joseph I. Goldstein,Dale E. Newbury,Eric Lifshin
视频video
图书封面Titlebook: Scanning Electron Microscopy and X-Ray Microanalysis; A Text for Biologist Joseph I. Goldstein,Dale E. Newbury,Eric Lifshin Book 1981 Sprin
描述This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter­ actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in t
出版日期Book 1981
关键词Hydra; X-ray; alloy; ceramics; deformation; electron microscopy; electron optics; fluorescence; materials sc
版次1
doihttps://doi.org/10.1007/978-1-4613-3273-2
isbn_softcover978-1-4613-3275-6
isbn_ebook978-1-4613-3273-2
copyrightSpringer Science+Business Media New York 1981
The information of publication is updating

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发表于 2025-3-21 21:22:38 | 显示全部楼层
Electron Optics,nd spot size are controlled. In this chapter we will discuss the various components of the electron optical system, develop the relationship between electron probe current and spot size, and discuss the factors which influence this relationship.
发表于 2025-3-22 03:08:11 | 显示全部楼层
Image Formation in the Scanning Electron Microscope,) the origin of the commonly encountered contrast mechanisms which arise from the electron-specimen interaction; (3) the characteristics of detectors for the various signals and their influence on the image; (4) signal quality and its effect on image quality; and (5) signal processing for the final display.
发表于 2025-3-22 05:20:13 | 显示全部楼层
Qualitative X-Ray Analysis, considered, errors can arise unless careful attention is paid to the problems of spectral interferences, artifacts, and the multiplicity of spectral lines observed for each element. Because of the differences in approach to qualitative EDS and WDS analysis, these techniques will be treated separately.
发表于 2025-3-22 09:46:33 | 显示全部楼层
by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general intro
发表于 2025-3-22 13:21:08 | 显示全部楼层
X-Ray Spectral Measurement: WDS and EDS,interactions (Chapter 3), which describes the mechanisms for both characteristic and continuum x-ray production. This chapter is concerned with the methods for detecting and measuring these signals as well as converting them into a useful form for qualitative and quantitative analysis.
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Practical Techniques of X-Ray Analysis,rly calibrated, (2) the operating conditions are adequate to give sufficient x-ray counts so that a given peak can be easily distinguished from the corresponding background level, and (3) no serious peak overlaps are present.
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发表于 2025-3-23 03:59:08 | 显示全部楼层
Book 1981 Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to
发表于 2025-3-23 09:31:38 | 显示全部楼层
Introduction, submicrometer scale. The scanning electron microscope and electron microprobe are two powerful instruments which permit the observation and characterization of heterogeneous organic and inorganic materials and surfaces on such a local scale. In both instruments, the area to be examined, or the micr
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