Titlebook: Scanning Electron Microscopy and X-Ray Microanalysis; A Text for Biologist Joseph I. Goldstein,Dale E. Newbury,Eric Lifshin Book 1981 Sprin

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Electron-Beam-Specimen Interactions,e beam electrons undergo within the specimen. The interactions can be generally divided into two classes: (1) elastic events, which affect the trajectories of the beam electrons within the specimen without significantly altering the energy, and (2) inelastic events, which result in a transfer of ene

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Image Formation in the Scanning Electron Microscope,mers to the field, or even by laymen unfamiliar with the instrument. However, there is frequently more than meets the eye in SEM images, even images of simple objects, and to gain the maximum amount of information, it is necessary to develop skills in image interpretation. Moreover, to ensure that t

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X-Ray Spectral Measurement: WDS and EDS,-ray signal generated by a focused electron beam. The subject of x-ray production has already been introduced in the chapter on electronbeam-specimen interactions (Chapter 3), which describes the mechanisms for both characteristic and continuum x-ray production. This chapter is concerned with the me

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Quantitative X-Ray Microanalysis, the form of thin foils and sections of organic material, the size of the analyzed microvolume is reduced to about one tenth of the value for bulk samples. For metals and alloys the ZAF technique is usually employed. Pure element or alloy standards can be used and the surfaces of the samples and sta

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Materials Specimen Preparation for SEM and X-Ray Microanalysis,cimen thickness is not a consideration as is the case in transmission electron microscopy. Therefore, bulk specimens can be examined in the SEM with a size limited only by considerations of accommodation in the specimen stage. For the examination of images of topography contrast from metal and ceram

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Coating Techniques for SEM and Microanalysis,a thin film of conducting material. This coating is necessary to eliminate or reduce the electric charge which builds up rapidly in a nonconducting specimen when scanned by a beam of high-energy electrons. Figures 10.1a and 10.1b show examples of pronounced and minor charging as observed in the SEM.

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