Titlebook: Optical Characterization of Thin Solid Films; Olaf Stenzel,Miloslav Ohlídal Book 2018 Springer International Publishing AG, part of Spring

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In Situ and Ex Situ Spectrophotometric Characterization of Single- and Multilayer-Coatings I: Basicsnd discuss the state of the art in spectrophotometry of single and multilayer coatings, including their in situ as well as ex situ versions. In situ spectrophotometry allows re-engineering as well as monitoring the deposition process of a growing coating, resulting in excellent specification adherence particularly in the field of optical coatings.

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In Situ and Ex Situ Spectrophotometric Characterization of Single- and Multilayer-Coatings II: Exper for characterization of uncoated substrates, single layer coatings of dielectrics, semiconductors, metals and organic coatings. Thereby, the focus has been set to the . model. Finally, the interplay of in situ and ex situ spectroscopy will be demonstrated for a multilayer antireflection coating (V-coating).

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Book 2018various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international top experts, all of whom are involved in industrial research and development projects.

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Characterization of Porous Zirconia Samples as an Example of the Interplay Between Optical and Non-o modelling efforts. As an example, we provide results on the characterization of porous zirconia samples by a combination of spectrophotometry and non-optical characterization techniques like transmission electron microscopy, energy dispersive x-ray spectroscopy and x-ray reflection.

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