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Titlebook: Optical Characterization of Thin Solid Films; Olaf Stenzel,Miloslav Ohlídal Book 2018 Springer International Publishing AG, part of Spring

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发表于 2025-3-21 17:51:35 | 显示全部楼层 |阅读模式
书目名称Optical Characterization of Thin Solid Films
编辑Olaf Stenzel,Miloslav Ohlídal
视频video
概述Offers a sophisticated synthesis of fundamental and applied topics and a didactic presentation.Excellent interconnectedness of chapters through authors‘ belonging to collaborating working groups.Writt
丛书名称Springer Series in Surface Sciences
图书封面Titlebook: Optical Characterization of Thin Solid Films;  Olaf Stenzel,Miloslav Ohlídal Book 2018 Springer International Publishing AG, part of Spring
描述.This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international top experts, all of whom are involved in industrial research and development projects..
出版日期Book 2018
关键词Optical Coating Characterization; Optical Properties of Thin Solid Films; Optical Constants; Interface
版次1
doihttps://doi.org/10.1007/978-3-319-75325-6
isbn_softcover978-3-030-09200-9
isbn_ebook978-3-319-75325-6Series ISSN 0931-5195 Series E-ISSN 2198-4743
issn_series 0931-5195
copyrightSpringer International Publishing AG, part of Springer Nature 2018
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Ivan Ohlídal,Jiří Vohánka,Martin Čermák,Daniel Franta
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Polarization Control by Deep Ultra Violet Wire Grid Polarizers and dichroism are very briefly explained and their limitations are discussed. An overview of commercially available elements is given to set wire grid polarizer in a bigger picture and the characterization of polarizing elements is described. Further the working principle, structural and material r
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https://doi.org/10.1007/978-3-319-75325-6Optical Coating Characterization; Optical Properties of Thin Solid Films; Optical Constants; Interface
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Introductionm construction parameters. The purpose of optical characterization is usually in the determination of film thickness, refractive index and extinction coefficient, porosity, surface roughness, film stoichiometry, film density and the like.
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