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Titlebook: Neutron-Transmutation-Doped Silicon; Jens Guldberg (Conference Chairman) Book 1981 Plenum Press, New York 1981 Thyristor.Wafer.control.def

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Impurity Interactions with Structural Defects in Irradiated Siliconesemble that produced by fast electron irradiation. Direct neutron collisions are most easily investigated in material that has been subjected to high fluences in reactors which may be less than ideal for the production of NTD silicon. Damage produced in these two ways will be discussed and special
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Defect Production During Neutron Doping of Sithe neutron energy spectra of different reactors are most apparent. We will discuss methods of estimating the displacement rate at which Si atoms are dislodged from their normal lattice sites during a neutron irradiation induced displacement cascade. We also will present the results of a variety of
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Electron Spin Resonance (ESR) Study on the Thermal Annealing of Defects Induced in Neutron Transmuta been found for float zone Si irradiated with thermal neutron at the flux of 2×3.n/cm.sec and Cd ratio to fast neutron of 15:1. One center was annealed out after annealing at 420°C but the other center, which was attributed to Si-Pi center still remained after annealing at 700°C. It was found that v
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A Facility and Program at IPNS to Study Defects Produced by Fast Neutrons in Semiconductorsunique opportunity to study the effects of fast-neutron bombardment of semiconductors. This user-oriented Facility will be described and the results of recent measurements of spallation neutron flux, flux gradients, and energy spectrum will be presented. A close similarity with the fast component of
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The Health and Safety Aspects of Neutron Doped Siliconprocess. Each year tens of tonnes of silicon ingots are being transported from producers to nuclear reactor centres, are then irradiated; transported back to the producers, machined, sliced and polished and the slices eventually incorporated in electronic devices with which the general public have c
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