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Titlebook: Neutron-Transmutation-Doped Silicon; Jens Guldberg (Conference Chairman) Book 1981 Plenum Press, New York 1981 Thyristor.Wafer.control.def

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书目名称Neutron-Transmutation-Doped Silicon
编辑Jens Guldberg (Conference Chairman)
视频video
图书封面Titlebook: Neutron-Transmutation-Doped Silicon;  Jens Guldberg (Conference Chairman) Book 1981 Plenum Press, New York 1981 Thyristor.Wafer.control.def
描述This volume contains the papers presented at the Third International Conference on Neutron Transmutation Doping of Silicon held in Copenhagen on August 27-29, 1980. The first symposium associated with neutron transmutation doping technology as such was arranged in 1976 at Oak Ridge National Laboratory by John Cleland. At this time it had become clear that the technology could be implemented on a commercial scale and that several types of power devices in the electronic industry would benefit from employing neutron transmutation doped silicon in the fabrication proces‘s‘. Two years later the Second International Conference on Neutron Transmutation Doping of Semiconductors was arranged at the University of Missouri, Columbia, by Jon Meese. On this occasion the various aspects of silicon fabrication were reviewed, including irradiation control, radiation induced defects, device optimization, and possible benefits of irradiating other semiconductor compounds. In view of the now wide spread acceptance of neutron doped silicon in the power device industry the present conference was largely directed towards the current status of transmutation doping of silicon. Accordingly, the scope of t
出版日期Book 1981
关键词Thyristor; Wafer; control; defects; design; development; energy; future; high voltage; industry; optimization;
版次1
doihttps://doi.org/10.1007/978-1-4613-3261-9
isbn_softcover978-1-4613-3263-3
isbn_ebook978-1-4613-3261-9
copyrightPlenum Press, New York 1981
The information of publication is updating

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书目名称Neutron-Transmutation-Doped Silicon读者反馈学科排名




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Defect Production During Neutron Doping of Simeasurements using EPR, optical absorption, Raman scattering and DLTS which have been used to observe a number of defects which have been produced in Si by room temperature neutron irradiation. The numbers of displacements observed by these techniques will be compared to a simple Kinchin-Pease cascade model..
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Optical Studies of Lattice Damage in Neutron-Transmutation-Doped Siliconntervals from 150 to 900°C.. All samples were irradiated in a reactor in- core position with a thermal-to-fast (≥1 MeV) neutron ratio of ∿ 5, so that the lattice damage introduced by thermal neutron absorption and (n, γ) recoils was negligible compared to that introduced by fast neutron collisions with Si atoms.
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Large Scale Production of NTD Silicon in the United Statese played by the starting material. Analysis of the possible sources of inaccuracies is made..An outline of a zone refining process for producing only NTD product is compared to a conventional one with a discussion of advantages of the two. Trends in the manufacture and usage of NTD float zone silicon are discussed
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Impurity Interactions with Structural Defects in Irradiated Siliconxes. It will be shown that irradiation and annealing procedures can lead to non-equilibrium defects involving these njnpurities. We shall also report on recent small angle neutron scattering SANS measurements which allow the sizes of clusters and the absolute numbers of defects involved to be estimated.
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Factors Affecting Phosphorus Production Rate in NTD Siliconh irradiation and annealing, and incomplete annealing. It is important for both the silicon manufacturer and the reactor service engineer to understand these factors if the accuracy of doping inherent in the NTD process is to be realized.
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