Titlebook: Nanometer Technology Designs; High-Quality Delay T Mohammad Tehranipoor,Nisar Ahmed Book 2008 Springer-Verlag US 2008 ATPG.at-speed tests.d

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IR-drop Tolerant At-speed Test Pattern Generation,signs to supply voltage noise is increasing. The supply noise is much larger during at-speed delay test compared to normal circuit operation since large number of transitions occur within a short time frame. Existing commercial ATPG tools do not consider the excessive supply noise that might occur i

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Pattern Generation for Power Supply Noise Analysis,formation can benefit both the design and failure anaysis teams. The generated test patterns can also be used for targeting supply noise effects during fabrication test. The design team can use this information to further analyze the power/ground network for driving maximum current to the circuit wi

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Testing SoC Interconnects for Signal Integrity,uck-at fault model can detect bridge and open faults. But, transient, timing, and noise related faults cannot be detected using traditional stuck-at and delay test patterns. New design-for-test (DFT) methods and pattern generation algorithms are required to effectively consider such faults in high-s

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of the . of the system do not apply when the latter has a non-trivial kernel. Therefore they require special treatment. The algebraic information regarding an isolated singularity can be captured by a finite, local basis of differentials expressing the . of the point.In the present article, we revie

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of the . of the system do not apply when the latter has a non-trivial kernel. Therefore they require special treatment. The algebraic information regarding an isolated singularity can be captured by a finite, local basis of differentials expressing the . of the point.In the present article, we revie

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D/CAM software has long been plagued by problems of robustness when it comes to modelling the results of operations such as intersections. Such geometries can lack watertightness and correct topology, requiring costly repair procedures to be applied prior to analysis or manufacturing. One technique

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