Titlebook: Long-Term Reliability of Nanometer VLSI Systems; Modeling, Analysis a Sheldon Tan,Mehdi Tahoori,Saman Kiamehr Book 2019 Springer Nature Swi

Conducive

Liability

恶名声

Physics-Based EM Modelingrtant Korhonen’s partial differential equation for void forming and void growth in the confined metal interconnect wires. We present the recently proposed compact two-phase EM models. We then show the limitations of such two-phase EM models.

fidelity

critique

Resource-Based EM Modeling DRM for Multi-Core Microprocessorsure-sensitive long-term reliability problems. Those techniques, which typically consist of dynamic voltage and frequency scaling (DVFS), task throttling, and clock gating, were first developed for single core microprocessors.

甜瓜

DRM and Optimization for Real-Time Embedded Systemsodels. Existing works include power management schemes, which exploits the available static and/or dynamic slack in the systems. For long-term reliability effects, reducing power will implicitly improve the reliability of a processor.

团结

IntroductionTI), Hot Carrier Injection (HCI), Random Telegraph Noise (RTN), and Time Dependent Dielectric Breakdown (TDDB). We discuss how this transistor aging effect is affected by various process and runtime variation effects and the impact of technology down-scaling on transistor aging reliability.

Barter

Learning-Based DRM and Energy Optimization for Manycore Dark Silicon Processorsower constraints will not allow all the cores to be active at the same time. Such manycore systems pose new challenges and opportunities for power/thermal and reliability management of those chips (Esmaeilzadeh et al., Proceedings of the 38th Annual International Symposium on Computer Architecture, ACM, New York, 2011).

考古学

统治人类

Fast EM Stress Evolution Analysis Using Krylov Subspace Methodilure model based on the Korhonen’s equation, mentioned in Chap. . was proposed. Initially, this EM model worked for only a single wire segment but has been extended to deal with multi-segment interconnect trees based on the projected steady-state stress.