Titlebook: Integrated Circuit Test Engineering; Modern Techniques Ian A. Grout Textbook 2006 Springer-Verlag London 2006 Hardware.SPICE.Transistor.Win

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System on a Chip (SoC) Test, once manufactured as a discrete chip-set on a printed circuit board within the single IC itself. A system once composed of multiple ICs can now be realised within a single IC, providing for physical size reduction, and leading to increased operating speed and portability for mobile applications. Th

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Test Pattern Generation and Fault Simulation,onal test. Structural tests are based on the development of test vectors to detect specific faults that are considered to exist in a circuit due to process defects. The generation of the necessary test vectors is undertaken using test pattern generation and fault simulation techniques and tools.

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Automatic Test Equipment (ATE) and Production Test, defect levels. The tests undertaken in production must be suitably comprehensive, but at the lowest cost possible. The role of the physical test equipment is essential to achieving this. During production test, Automatic Test Equipment (ATE) is used to reduce the test times by automating as much of

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Test Economics,to identify the cost to test, the different parts that go into the creation and operation of a production test program must be identified, and a value associated with that part. A test economics model can be created which will allow for these costs to be formally defined and analysed.

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Textbook 2006. encapsulates the subject as it stands today. After introductory background from basic testing rules to trends in technology, the reader learns about: fabrication processes; a complete range of detailed tests and procedures; how to design for testability; fault simulation; automatic test equipment

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