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Titlebook: Integrated Circuit Test Engineering; Modern Techniques Ian A. Grout Textbook 2006 Springer-Verlag London 2006 Hardware.SPICE.Transistor.Win

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Mixed-Signal Test,ign and analysis of complex circuit and systems. This is achieved by modeling the signals as discrete-time, discrete level events. The interface between the analogue and digital, the mixed-signal interface, provides many challenges to test and the requirement to develop efficient, cost-effective and comprehensive test procedures.
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System on a Chip (SoC) Test,alised within a single IC, providing for physical size reduction, and leading to increased operating speed and portability for mobile applications. The system on a chip (SoC) is testament to the recent advances in design methods and fabrication processes. However, this leads to increased problems for test that need to be resolved.
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Input-Output Test,Within an Integrated Circuit, the main circuit functionality is performed within the core of the circuit die. However, there is the need to provide for signal I/O and power supply connections between the core of the die and the package. The cells within the periphery of the device provide for this operation.
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