Titlebook: Hot-Carrier Reliability of MOS VLSI Circuits; Yusuf Leblebici,Sung-Mo (Steve) Kang Book 1993 Springer Science+Business Media New York 1993

和蔼

Yusuf Leblebici,Sung-Mo (Steve) Kangsted various caregiving-related negative experiences might be related to older spousal caregivers’ mental health status, the components of psychological well-being (PSW) among older spousal caregivers have not been fully explored. This study examined the association between spousal caregiver status

性行为放纵者

Assemble

删除

HERE

Nuance

Yusuf Leblebici,Sung-Mo (Steve) Kangf elder abuse, which creates new challenges in the form of the indirect and direct victimization of children in the home. However, research on the relationship between children’s witnessing of elder abuse and their victimization experiences is limited. This study examines the physical and mental hea

支柱

Yusuf Leblebici,Sung-Mo (Steve) Kangf elder abuse, which creates new challenges in the form of the indirect and direct victimization of children in the home. However, research on the relationship between children’s witnessing of elder abuse and their victimization experiences is limited. This study examines the physical and mental hea

Respond

ers in debugging issues related to program correctness. The motivation is twofold. First, researchers widely use computation graphs to analyze dynamic program behavior. Second, most past work focused on visualizing performance bottlenecks rather than correctness issues. This paper’s contributions ar

Pruritus

Oxide Degradation Mechanisms in MOS Transistors,ation of the oxide damage, the dependence of the degradation mechanisms upon various operating conditions and temperature, and the effects of the oxide damage upon device characteristics, will also be examined. Most of the following discussion is focussed on nMOS transistors, for which the hot-carri

轨道