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Titlebook: Gallium Oxide; Materials Properties Masataka Higashiwaki,Shizuo Fujita Book 2020 Springer Nature Switzerland AG 2020 Ga2O3.transparent cond

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Czochralski Method of high structural quality at low production costs per volume unit. A possibility of obtaining bulk β-Ga.O. single crystals by the Czochralski method expands the diversity of growth technologies for this compound towards large volumes and high quality suitable for epitaxial growth of layers and dev
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Floating Zone Method, Edge-Defined Film-Fed Growth Method, and Wafer Manufacturing. The floating zone method section briefly mentions the method’s history and typical growth conditions. The section on edge-defined film-fed growth method discusses the history, growth sequence, and conditions. It also covers the material properties of edge-defined film-fed grown β-Ga.O. such as twi
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Plasma-Assisted Molecular Beam Epitaxy 2elated growth kinetics of Ga.O. explaining the observed growth rate behavior as function of all growth parameters. The binary growth kinetics of Ga.O. is then compared to that of its related oxides In.O. and SnO.. During the ternary growth of (In.Ga.).O., thermodynamic aspects based on different met
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Metal Organic Chemical Vapor Deposition 2emical vapor deposition (MOCVD) technique. Variations in growth conditions and substrates result in the growth of different polymorphs of Ga.O.  or combinations of them. .-Ga.O.is consistently reported as the dominant phase to grow at high substrate temperatures >700 .C. At lower substrate temperatu
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Halide Vapor Phase Epitaxy 1alysis and growth experiments. The thermodynamic analysis clarified that growth of Ga.O. is expected at high temperatures around 1000 °C using an inert carrier gas. The experimental results revealed that homoepitaxial growth of unintentionally doped (UID) layers with a low effective donor concentrat
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