Titlebook: Electron and Ion Optics; Miklos Szilagyi Book 1988 Plenum Press, New York 1988 Wafer.analog.circuit.computer.electromagnetic field.electro

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Cristina Castañon MD,Pedro A. Reyes MDchines, scanning electron microscopes, and some other analytical instruments. Its purpose is to . the beam over a surface. The main feature of this type of deflection is that the undeflected beam has a ., therefore the analysis of deflection can be based on the principles used in the previous chapters.

河流

Determination of Electric and Magnetic Fields,itor has fringing fields at its ends). Before we start to study the particle behavior in more complicated nonuniform fields, first we must be able to determine the distributions of those fields in space. (In this book time-dependent fields will not be treated.)

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抛媚眼

LEVER

COMA

High-Intensity Beams,We have discussed the role of the beam’s own space charge as a source of aberrations in Section 5-6-2. We know that space charge has two basic forms: distributed charge and interactions of individual particles. In this chapter the problem of . will be considered in some detail, followed by a short discussion of the ..

兵团

978-1-4612-8247-1Plenum Press, New York 1988

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Microdeviceshttp://image.papertrans.cn/e/image/306175.jpg

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Introductory Survey,name expresses the close analogy between the transmission of light through refractive media and the motion of charged particles in electromagnetic fields. It is a huge field with a relatively short history. Although the analogy between classical mechanics and geometrical optics was discovered by Ham

PATRI

Motion of Charged Particles in Electric and Magnetic Fields, particle is defined by Eq. (1-14) and we also know that the force in general is defined by the Newtonian law of motion. where . = . is the particle’s momentum and.is the relativistic mass of the particle (m0 is its rest mass). Substituting the Lorentz force (1-14) and Eqs. (1-11) and (1-12) into Eq