Titlebook: Contactless VLSI Measurement and Testing Techniques; Selahattin Sayil Book 2018 Springer International Publishing AG 2018 Integrated Circu

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Other Techniques Based on the Contacting Probe,uctural or defect-based testing techniques. A functional test applies predetermined set of patterns at the inputs of an integrated circuit and compares to the expected responses. The goal is to verify the functionality of the chip under test. Structural tests, on the other hand, target on the defect

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Electron Beam and Photoemission Probing,ntegrated circuits. This technique uses an electron beam to stimulate secondary electron emission from metallized surfaces. It uses the energy distribution function of the released secondary electrons which is in turn a function of the voltage at the test point. A very attractive feature of EBT is t

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Electric Force Microscope, Capacitive Coupling, and Scanning Magnetoresistive Probe,connected line creates an electric force between the tip and the device under test which causes a detectable bending of the cantilever. This bending amount is optically detected and electrically analyzed by a lock-in amplifier. In capacitive coupling method, an electrode is placed in close proximity