Titlebook: Contactless VLSI Measurement and Testing Techniques; Selahattin Sayil Book 2018 Springer International Publishing AG 2018 Integrated Circu

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lve many of the challenges associated with conventional mechanical wafer testing. The techniques described in this book address the increasing demands for internal access of the logic state of a node within a chip under test..978-3-319-88819-4978-3-319-69673-7

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us optical contactless testing techniques, such as Electro-O.This book provides readers with a comprehensive overview of the state-of-the-art in optical contactless probing approaches, in order to fill a gap in the literature on VLSI Testing.  The author highlights the inherent difficulties encounte

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https://doi.org/10.1007/978-3-662-22585-1growing portion of a product’s total costs. DFT techniques are valuable methods for helping solve the growing test problem. The cost is the increased silicon circuit area to accommodate the hardware overhead and potentially reduced circuit performance.

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