SCIE期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 2024/2025影响因子:1.142 (J ELECTRON TEST) (0923-8174). (ENGINEE

蛰伏

辩论

Submitted on: 14 April 2005. Revised on: 16 June 2005. Accepted on: 29 July 2005. ___________________JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS

完成才能战胜

过分

愤愤不平

Submitted on: 10 September 2001. Revised on: 01 January 2002. Accepted on: 14 January 2002. ___________________JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS

Nmda-Receptor

Trabeculoplasty

sacrum

皮萨

Extricate

Submitted on: 09 July 2007. Revised on: 14 August 2007. Accepted on: 09 September 2007. ___________________JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS