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派博传思国际中心 »期刊书目

› Journal of SCIE
› ENGINEERING, ELECTRICAL & ELECTRONIC(工程，电气和电子)

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SCIE期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 2024/2025影响因子:1.142 (J ELECTRON TEST) (0923-8174). (ENGINEE

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发表于 2025-3-21 19:42:53 | 显示全部楼层 |阅读模式
期刊全称JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
期刊简称J ELECTRON TEST
影响因子20241.142
视频video
ISSN0923-8174
eISSN1573-0727
出版商SPRINGER
发行地址ONE NEW YORK PLAZA, SUITE 4600 , NEW YORK, United States, NY, 10004
学科分类1.Science Citation Index Expanded (SCIE)--Engineering, Electrical & Electronic; 2.Current Contents Electronics & Telecommunications Collection--Electronics & Electrical Engineering; 3.Current Contents Engineering, Computing & Technology--Electrical & Electronics Engineering; 4.Essential Science Indicators--Engineering;
出版语言English
The information of publication is updating

SCIE(SCI)期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS(20 21 REV HIST)影响因子


SCIE(SCI)期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS(J ELECTRON TEST)影响因子@(工程，电气和电子)学科排名


SCIE(SCI)期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS(20 21 REV HIST)总引论文


SCIE(SCI)期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS(J ELECTRON TEST)总引论文@(工程，电气和电子)学科排名


SCIE(SCI)期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS(20 21 REV HIST)影响因子


SCIE(SCI)期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS(J ELECTRON TEST)总引频次@(工程，电气和电子)学科排名


SCIE(SCI)期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS(20 21 REV HIST)即时影响因子


SCIE(SCI)期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS(J ELECTRON TEST)即时影响因子@(工程，电气和电子)学科排名


SCIE(SCI)期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS(20 21 REV HIST)五年累积影响因子


SCIE(SCI)期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS(J ELECTRON TEST)五年累积影响因子@(工程，电气和电子)学科排名


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Submitted on: 22 June 2002. Revised on: 02 October 2002. Accepted on: 10 November 2002. ___________________JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
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Submitted on: 10 November 2004. Revised on: 31 January 2005. Accepted on: 07 March 2005. ___________________JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
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Submitted on: 26 February 2003. Revised on: 21 June 2003. Accepted on: 15 August 2003. ___________________JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
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Submitted on: 26 November 2010. Revised on: 01 February 2011. Accepted on: 02 March 2011. ___________________JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
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