Titlebook: Applied Scanning Probe Methods XII; Characterization Bharat Bhushan,Harald Fuchs Book 2009 Springer-Verlag Berlin Heidelberg 2009 AFM.REM.U

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1434-4904 nitiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where exible substrates will play a major role these issues will become of utmost importance. It is therefore necess

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Book 2009MEMS). Es- cially in organic electronics where exible substrates will play a major role these issues will become of utmost importance. It is therefore necessary to develop me- ods which in situ allow the experimental investigation of surface deformation and fracture processes in thin layers at a mic

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N.L. DOBRETSOV,V.S. ZYKIN,V.S. ZYKINA In addition to imaging the surface topography of live cells, atomic force microscopy (AFM) is increasingly used to probe their chemical groups and biological receptors. In chemical force microscopy, AFM tips are modified with specific functional groups, thereby allowing investigators to probe chemi

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Nikolay Dronin,Andrei Kirilenkothe samples, such as nanoapertures or sharp metallic tips. In this chapter, after describing the basic principles of SNOM, we review the state-of-the-art in the experimental implementations and applications of fluorescence, infrared and Raman SNOM for the detection and imaging of DNA oligonucleotide

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Nikolay Dronin,Andrei Kirilenkonterpretation of experiments related to scanning local probe methods. These mechanical properties can be studied by establishing a very small contact, a nanocontact, between a tip and a surface. The elasticity and fracture events during the controlled breaking of a nanocontact as the tip is separate

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Arturo Nikolayevich Chilingarov experimental analysis of the thermal noise motion of the cantilever, the dependency of the hydrodynamic damping versus the cantilever–surface separation was evaluated. In the second part, we present an improvement of the excitation holder that allows us to remove the spurious peaks not correspondin