| 期刊全称 | Applied Scanning Probe Methods XII | | 期刊简称 | Characterization | | 影响因子2023 | Bharat Bhushan,Harald Fuchs | | 视频video | http://file.papertrans.cn/161/160126/160126.mp4 | | 发行地址 | First book summarizing the state of the art of this technique.Real industrial applications included.Includes supplementary material: | | 学科分类 | NanoScience and Technology | | 图书封面 |  | | 影响因子 | Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where exible substrates will play a major role these issues will become of utmost importance. It is therefore necessary to develop me- ods which in situ allow the experimental investigation of surface deformation and fracture processes in thin layers at a micro and nanometer scale. While scanning electron microscopy (SEM) might be used it is also associated with some major experimental drawbacks. First of all if polymers are investigated they usually have to be coated with a metal layer due to their commonly non-conductive nature. Additi- ally they might be damaged by the electron beam of the microscope or the vacuum might cause outgasing of solvents or evaporation of water and thus change material properties. Furthermore, for all kinds of materials a considerable amount of expe- mental effort is necessary to build a tensile testing machine that ts into the chamber. Therefore, a very promising alternative to SEM is based on the use of an atomic force microscope (AFM) to observe in situ surface | | Pindex | Book 2009 |
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