Titlebook: Surface-Enhanced Raman Scattering; Physics and Applicat Katrin Kneipp,Martin Moskovits,Harald Kneipp Book 2006 Springer-Verlag Berlin Heide

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Nicholas P. W. Pieczonka,Paul J. G. Goulet,Ricardo F. Arocafewyears, have brought about remarkable series of advances in SPMlithography.Some of these advances have been in the control of thetip which has allowed the scanning speed to be increased frommum/second to mm/second.Both non-contact and in-contact writinghave been demonstrated as has controlled writ

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Prabhat Verma,Yasushi Inouye,Satoshi Kawatao handle using today’s processing capabilities. These results clearly show new perspectives for microscopy, where large, complex structures are to be investigated on the nanometer scale. Furthermore, new avenues have been opened up in SFM lithography, where patterns on an area of 1 cm. have been wri

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Anna Rita Bizzarri,Salvatore Cannistraroerate real-space images of surfaces with atomic resolution and has triggered development of new classes of STM-related techniques. In 1986, Binnig, Quate, and Gerber demonstrated atomic force microscope (AFM) based on the mechanical detection of the Van der Waals forces between the tip and the surfa

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Daniel Murgida,Peter Hildebrandtance measurements (scanning impedance microscopy). Applying these two configurations, nanometer scale measurement and visualization of impedance is demonstrated for a wide variety of materials systems, including solid electrolytes, semiconductors, electroceramics, corrosion research, and fuel cell s

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Vladimir P. Drachev,Vladimir M. Shalaev multifrequency AFM, high-speed imaging of biological matter, scanning x-ray microscopy, andtip-enhanced Raman scattering. . The book serves as a general, hands-on guide for all types of classes that address scanning probe microscopy. It is ideally suited for graduate and advanced undergraduate stud

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