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Titlebook: Surface Analysis Methods in Materials Science; D. John O’Connor,Brett A. Sexton,Roger St. C. Smar Book 2003Latest edition Springer-Verlag

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书目名称Surface Analysis Methods in Materials Science
编辑D. John O’Connor,Brett A. Sexton,Roger St. C. Smar
视频video
概述Comprehensive compilation of surface analysis tools for physicists, materials scientists, chemists and engineers.Includes supplementary material:
丛书名称Springer Series in Surface Sciences
图书封面Titlebook: Surface Analysis Methods in Materials Science;  D. John O’Connor,Brett A. Sexton,Roger St. C. Smar Book 2003Latest edition Springer-Verlag
描述The success of the first edition of this broad appeal book prompted the prepa­ ration of an updated and expanded second edition. The field of surface anal­ ysis is constantly changing as it answers the need to provide more specific and more detailed information about surface composition and structure in advanced materials science applications. The content of the second edition meets that need by including new techniques and expanded applications. Newcastle John O‘Connor Clayton Brett Sexton Adelaide Roger Smart January 2003 Preface to the First Edition The idea for this book stemmed from a remark by Philip Jennings of Mur­ doch University in a discussion session following a regular meeting of the Australian Surface Science group. He observed that a text on surface anal­ ysis and applications to materials suitable for final year undergraduate and postgraduate science students was not currently available. Furthermore, the members of the Australian Surface Science group had the research experi­ ence and range of coverage of surface analytical techniques and applications to provide a text for this purpose. A list of techniques and applications to be included was agreed at that meeting.
出版日期Book 2003Latest edition
关键词EXAFS; Helium-Atom-Streuung; SIMS; Vibration; ceramics; chemistry; electron microscope; materials engineeri
版次2
doihttps://doi.org/10.1007/978-3-662-05227-3
isbn_softcover978-3-642-07458-5
isbn_ebook978-3-662-05227-3Series ISSN 0931-5195 Series E-ISSN 2198-4743
issn_series 0931-5195
copyrightSpringer-Verlag Berlin Heidelberg 2003
The information of publication is updating

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978-3-642-07458-5Springer-Verlag Berlin Heidelberg 2003
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Surface Analysis Methods in Materials Science978-3-662-05227-3Series ISSN 0931-5195 Series E-ISSN 2198-4743
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Sputter Depth Profilingand so does not significantly alter bulk atomic concentrations. (math) and Cs. are favoured for SIMS since they increase secondary ion yields and reduce matrix effects. However, this is at the price of reduced sputter rates and profile distortion though compound formation and segregation. Liquid met
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