Titlebook: Statistical and Probabilistic Models in Reliability; D. C. Ionescu,N. Limnios Book 1999 Springer Science+Business Media New York 1999 Esti

逗它小傻瓜

Modelling the Reliability of a Complex System Under Stress Environmentt stress process may represent impulsions, shocks, radioactive emissions. We generalize the results obtained for one component, using the model introduced in [Gaudoin and Soler (1997)]. We investigate the stress consequences with respect to the system architecture.

kindred

indifferent

hermitage

lactic

CPIT Goodness-Of-Fit Tests for Reliability Growth Modelsation of O’Reilly-Quesenberry. The general CPIT methodology is described. Then the CPIT tests are derived for the Homogeneous Poisson Process, Jelinski-Moranda model, Goel-Okumoto model and the Power-Law Process. The power of these tests is assessed through simulations and finally, they are applied to real software reliability data.

旋转一周

蘑菇

Fibroid

On the Failure Rate of Components Subjected to a Diffuse Stress Environmentinstantaneous, cumulative and others). Explicit and implicit formulas are derived for the resulting failure rate of the component from which it is shown that the stress contribution part rapidly converges to some finite constant value at least in the case of an instantaneous effect of the stress.

使人烦燥

On Limit Reliability Functions of Large Systems. Part IIlity functions for the systems being a generalization of series-parallel and parallel-series systems discussed in part 1 is presented. Namely, the partial solution of this problem for hierarchical series-parallel homogeneous regular systems is given.

Limited

Book 1999i­ cal Methods in Reliability held at the Politehnica University of Bucharest from 16 to 19 September 1997. The papers have been divided into three sections: statistical methods, probabilistic methods, and special techniques and appli­ cations. Of course, as with any classification, some papers coul