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Titlebook: Statistical and Probabilistic Models in Reliability; D. C. Ionescu,N. Limnios Book 1999 Springer Science+Business Media New York 1999 Esti

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书目名称Statistical and Probabilistic Models in Reliability
编辑D. C. Ionescu,N. Limnios
视频video
丛书名称Statistics for Industry and Technology
图书封面Titlebook: Statistical and Probabilistic Models in Reliability;  D. C. Ionescu,N. Limnios Book 1999 Springer Science+Business Media New York 1999 Esti
描述This volume consists of twenty-four papers selected by the editors from the sixty-one papers presented at the 1st International Conference on Mathemati­ cal Methods in Reliability held at the Politehnica University of Bucharest from 16 to 19 September 1997. The papers have been divided into three sections: statistical methods, probabilistic methods, and special techniques and appli­ cations. Of course, as with any classification, some papers could be as well assigned to other sections. Problems in reliability are encountered in items in everyday usage. Relia­ bility is an important feature of household appliances, cars, telephones, power supplies, and so on, whether viewed from the vantage of the producer or the consumer. Important decisions are based on the reliability of the product. Obtaining systems that perform adequately for a specified period of time in a given environment is an important goal for both government and industry. Hence study and use of reliability theory, which can be applied in the research, development, and production phases of a system to enable the user to evaluate and improve performance, is a worthwhile venture. If reliability theory is to be useful, it m
出版日期Book 1999
关键词Estimator; Markov; Maxima; Observable; Survival analysis; algorithm; best fit; calculus; classification; mode
版次1
doihttps://doi.org/10.1007/978-1-4612-1782-4
isbn_softcover978-1-4612-7280-9
isbn_ebook978-1-4612-1782-4Series ISSN 2364-6241 Series E-ISSN 2364-625X
issn_series 2364-6241
copyrightSpringer Science+Business Media New York 1999
The information of publication is updating

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Statistical and Probabilistic Models in Reliability978-1-4612-1782-4Series ISSN 2364-6241 Series E-ISSN 2364-625X
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On Semiparametric Estimation of Reliability From Accelerated Life DataAdditive accumulation of damages model and its generalizations are considered. Semiparametric estimation procedure of the survival function under the normal stress from accelerated life testing data is proposed. Experiments with step-stresses with random switch up moments are considered. Asymptotic properties of estimation are investigated.
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Analysis of Reliability Characteristics Estimators in Accelerated Life TestingThe efficiency of nonpaxametric estimators with respect to parametric estimators for the accelerated failure time model is considered. This article gives the asymptotic properties of the parametric estimators and recall the properties of the nonparametric estimators proved by Bagdonavicius and Nikulin (1997).
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Chi-Squared Goodness of Fit Test for Doubly Censored Data With Applications in Survival Analysis andWe consider the problem of testing the goodness of fit of a parametric family .(·; θ) of the survival distributions from some doubly censored data. We investigate Pearson-type chi-squared statistics which compare the Tsai and Growly (1985) estimator ..(.) to the parametric MLE ..).
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Markovian Repairman Problems. Classification and ApproximationClassification of Markov repairable systems are given by the equilibrium point of the velocity drift. The diffusion approximation of the normalized queueing process by the Ornstein-Uhlenbeck process is established.
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On the Failure RateSome considerations concerning the concept of failure rate are presented. For a semi-Markov process are given equations of Markov renewal type using the failure rates of passing from a state into another. The existence and uniqueness of the solutions is discussed.
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